American Journal of Materials Synthesis and Processing

Volume 4, Issue 2, December 2019

  • Electron Impact Ionization Mass Spectra of 3-Amino 5,6-Dimethoxyl-2-Methyl Quinazolin-4-(3H)-One Derivative

    Osarumwense Peter Osarodion, Edema Mary Orile, UsifohCyril Odianosen

    Issue: Volume 4, Issue 2, December 2019
    Pages: 62-67
    Received: 6 June 2019
    Accepted: 8 July 2019
    Published: 7 August 2019
    Abstract: Background: The synthesis of novel heterocyclic derivatives has attracted considerable attention. The explosive growth of heterocyclic chemistry is emphasized by the large number of research publications, monographs, and reviews. The heterocyclic organic compounds are extensively disseminated in natural and synthetic medicinal chemistry and are vit... Show More
  • Studies on Thermal Stability, Shelf Life and Electrochemical Measurement of Methanol Extract of Air Dried Alchornea Laxiflora Leaves in Corrosion Prevention

    Oluwafemi Lawrence Adebayo, Emmanuel Folorunso Olasehinde, Labunmi Lajide, Daniel Oloruntoba, Morenike Grace Ajayi

    Issue: Volume 4, Issue 2, December 2019
    Pages: 68-74
    Received: 25 July 2019
    Accepted: 5 September 2019
    Published: 22 November 2019
    Abstract: The aim of this study was to determine the thermal stability and shelf life of the extract together with the influence of extract concentration, temperature and pH variation of the acidic medium on the inhibition efficiency using 1.0 M Sodium hydroxide. The dried plant samples were ground, sieved using 0.25µm and then extracted with methanol using ... Show More
  • Analysis of Optical Properties of SiO2 Thin Films for Various Thicknesses and Substrate Material Using Matlab Code

    Zina Abd Alameer Al Shadidi, Ahmad Kadhum Falih

    Issue: Volume 4, Issue 2, December 2019
    Pages: 75-80
    Received: 23 October 2019
    Accepted: 19 November 2019
    Published: 25 November 2019
    Abstract: Theoretical study using mathematical analysis supported by Matlab code was created, for Silicon dioxide (SiO2) thin films on various substrate materials (Aluminium, quartz, and silicon), and different thicknesses. Reflectance and transmittance of the (SiO2) thin film is strongly dependent on the electromagnetic wavelength. Many physical results wer... Show More